Pencitraan Retakan Mikro Pada Sel Surya Silikon Dengan SEM (Scanning Electron Microscopy)

Gunawan, Wawan (2020) Pencitraan Retakan Mikro Pada Sel Surya Silikon Dengan SEM (Scanning Electron Microscopy). S2 thesis, Universitas Kristen Indonesia.

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Abstract

Sel surya berbasis silikon baik monokristalin ataupun polikristalin terbukti banyak dipakai di industri fotovoltaik dibandingkan bahan sel surya lainnya seperti titanium oksida atau germanium karena bahan yang berlimpah dan proses produksi yang hemat, namun masalah terjadi karena adanya cacat (retakan) internal maupun eksternal dalam wafer silikon tersebut. Retakan sel surya silikon tersebut terjadi karena proses pembuatan ataupun pada saat mengaplikasikannya dilapangan dalam waktu yang relatif singkat. Penelitianpun dilakukan untuk mengetahui penyebab keretakan tersebut dan seberapa besar kerusakan yang terjadi sehingga mempengaruhi performa sel surya silikon. Dengan menggunakan SEM (Scanning Electron Microscopy) kita akan membuktikan bahwa, apakah terlihat jelas kerusakan yang terjadi yang diakibatkan kegagalan produksi ataupun pengaruh eksternal yang menyebabkan sel surya mengalami cacat (keretakan mikro), berlubang, terbakar dan lain sebagainya. Teknologi canggih yang dimiliki SEM diharapkan dapat diandalkan untuk mengetahui lokasi terjadinya kerusakan dengan cepat dan tepat karena hasil yang ditampilkan sangat akurat sehingga diharapkan dapat menjadi evaluasi untuk proses produksi sel surya di masa yang akan datang. Kata Kunci : Sel surya silikon, cacat, SEM./ Both monocrystalline and polycrystalline silicon based solar cells are proven to be widely used in the photovoltaic industry compared to other solar cell material such as titanium oxide or germanium due to abundant materials and economical production processes, however the problem occurs due to internal (crack) defects in the silicon wafers. The cracks of silicon solar cells occur due to the manufacturing process or when applying them to the field in a relatively short time. Research was also carried out to determine the cause of the cracks and how much damage had occurred that affected the performance of silicon solar cells. By using SEM (Scanning Electron Microscopy) we will prove that, is it clear that the damage caused by production failure of external influences causes defects (micro cracks), holes, burns and so on. The advanced technology owned by SEM is expected to be reliable to find the location of the damage quickly and precisely because the result displayed are very accurate so that it is expected to be an evaluation for the solar cell production process in the future. Keywords : Silicon solar cell, defects, SEM

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